| 詳細說明: Knights Technology™ Merlin’s Framework™
Connect your FA equipment to your design layout and inspection data using
our proven CAD navigation software solution - Merlin’s Framework.
Merlin is a key tool for the new technologies and techniques including flip chips and
back side fault isolation and analysis - helping FA engineers with root cause identification.
You can use Merlin to view a design’s layout, netlist, and schematic to navigate FA
equipment to a precise point to inspect, probe, or cut the suspected failure. In addition, you
can crossmap the layout, netlist, and schematic to simultaneously view all three domains
as well as overlay a captured image on the layout to precisely locate the image in the design
data.
Highlights：
- Robust suite of products.
- More than 1500 nodes installed world wide.
- "Industry Standard" for analytical equipment to design data interface.
- Continuous development on databases to keep track with the "state of the art" in the Electronic
Design Automation field.
List of equipment compatibility：
• Analytical Probe Stations
•Atomic Force Microscopes (AFM)
•Electron Beam Probers (E-Beam)
•Electronic Design Automation (EDA)
Verification & Test Software
•Emission Microscopes
•Energy Dispersive (EDS) X-Ray
Microanalysis Systems
•Focused Ion Beam (FIB)
•In-Line Inspection Data Links
•Laser Cutters •Laser Scanning Microscopes
•Laser Scanning Microscopes (LSM), IR
Imaging
•Mechanical Stage Controllers
•Microchemical Laser Workstations
•Optical Beam Induced Current (OBIC)
Instruments
•ptical Microscope Review Stations
•Scanning Electron Microscopes (SEM)
Applications：
Maskview ™ - Provides all viewing and manipulation functions for handling device layout graphics. The
central application of Merlin’s Framework, Maskview is frequently customized to reflect a
customer’s specific equipment environment and needs.
Netview ™ - Extends the functionality of Maskview by adding views of netlist data and hierarchies that can
be crossmapped to the Maskview layout image.
Schematic Options - Facilitates fault localization and analysis by linking the logic design directly to the physical
layout. The schematic options can create schematics when none is available and crossmap
the design information with the device layout and netlist. Using a combination of Knights
powerful schematic options, FA and design engineers can work together to isolate and
correct defects.
Defect WaferMap™ (DWM) - Provides viewing and manipulation functions for wafer map data. DWM also enables the
integration of defect data with Maskview’s layouts by transferring defect coordinates from
inspection equipment to Merlin’s databases.
K-BitMap ™ - Allows equipment CAD Navigation when analyzing memory chips by identifying the physical
location of failing memory cells. It eliminates tedious screen counting by converting the logical
address or row and column coordinates to the physical location.
Also see our next generation CAD navigation software - Camelot™
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研磨/拋光/切割
產品類別:研磨/拋光/切割 - 
