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產品類別:研磨/拋光/切割 -
產品名稱:良率管理系統
產品編號:23
產品簡介:
詳細說明:
Knights Technology™ Merlin’s Framework™      
    
  Connect your FA equipment to your design layout and inspection data using  
our proven CAD navigation software solution - Merlin’s Framework.   

  Merlin is a key tool for the new technologies and techniques including flip chips and
 back side fault isolation and analysis - helping FA engineers with root cause identification.   

  You can use Merlin to view a design’s layout, netlist, and schematic to navigate FA 
equipment to a precise point to inspect, probe, or cut the suspected failure. In addition, you  
can crossmap the layout, netlist, and schematic to simultaneously view all three domains  
as well as overlay a captured image on the layout to precisely locate the image in the design 
 data.    


    
Highlights:   

- Robust suite of products.    
- More than 1500 nodes installed world wide.    
- "Industry Standard" for analytical equipment to design data interface.    
- Continuous development on databases to keep track with the "state of the art" in the Electronic 
 Design Automation field.   


    
List of equipment compatibility:   
• Analytical Probe Stations    
•Atomic Force Microscopes (AFM)    
•Electron Beam Probers (E-Beam)    
•Electronic Design Automation (EDA)    
  Verification & Test Software   
•Emission Microscopes    
•Energy Dispersive (EDS) X-Ray    
  Microanalysis Systems    
•Focused Ion Beam (FIB)    
•In-Line Inspection Data Links   
•Laser Cutters •Laser Scanning Microscopes   
•Laser Scanning Microscopes (LSM), IR    
  Imaging   
•Mechanical Stage Controllers   
•Microchemical Laser Workstations    
•Optical Beam Induced Current (OBIC)    
  Instruments   
•ptical Microscope Review Stations    
•Scanning Electron Microscopes (SEM)    

    
Applications:   

Maskview ™ - Provides all viewing and manipulation functions for handling device layout graphics. The  
central application of Merlin’s Framework, Maskview is frequently customized to reflect a  
customer’s specific equipment environment and needs.   

Netview ™ - Extends the functionality of Maskview by adding views of netlist data and hierarchies that can 
 be crossmapped to the Maskview layout image.   

Schematic Options - Facilitates fault localization and analysis by linking the logic design directly to the physical  
layout. The schematic options can create schematics when none is available and crossmap  
the design information with the device layout and netlist. Using a combination of Knights 
 powerful schematic options, FA and design engineers can work together to isolate and  
correct defects.   

Defect WaferMap™ (DWM) - Provides viewing and manipulation functions for wafer map data. DWM also enables the  
integration of defect data with Maskview’s layouts by transferring defect coordinates from  
inspection equipment to Merlin’s databases.   

K-BitMap ™ - Allows equipment CAD Navigation when analyzing memory chips by identifying the physical 
 location of failing memory cells. It eliminates tedious screen counting by converting the logical  
address or row and column coordinates to the physical location.   
    
Also see our next generation CAD navigation software - Camelot™    
  
線上訂購
 
 

Ellipsiz iNETEST CO., Ltd. All Rights Reserved. Inc. All Rights Reserved. 3F.,No.31, Sintai Rd.,Jhubei City,Hsin Chu County 302-52, Taiwan, R.O.C TEL:+886 03 6561595 FAX:+886 03 5520347
新竹縣竹北市新泰路聯合大樓31號3F