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Product type:Wafer-Appearance-Inspection-Device -
Name:8~12 Wafer Appearance Defect
Item:2203
Description:
epitome:

1.8”, 12” wafer loading capacity

2. FOUB/FOSB Loadport Module

3. With opner to achieve seamless wafer supply by changing the arm, macro visual inspection rejection registration,

4. Microscopic inspection to measure SW

5. Precise wafer sensing with state-of-the-art loadport modules

6. Simple and cost-effective automated wafer handling and inspection equipment High-resolution pre-aligner and macro tilt

7. Module 1000-class wafer transfer robot Standard loadport module for higher wafer mapping sensitivity User-friendly latest user interface and operating system software technology

8. Ergonomics, Cognitive Engineering Design and Interface Windows-based programs on touchscreen PCs Macro/Micro (tilted, back/center)

9. Detect BCR/ RFID/ OCR reader option Free moving clutch stage 

10. Rotating vacuum chuck for optimal stability of wafer handling

Order
 
 

Ellipsiz iNETEST CO., Ltd. All Rights Reserved. Inc. All Rights Reserved. 3F.,No.35, Sintai Rd.,Jhubei City,Hsin Chu County 302-52, Taiwan, R.O.C TEL:+886 03 6561595 FAX:+886 03 5520347
新竹縣竹北市新泰路聯合大樓35號3F